Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...
EDN

Electroglas Intros Automated Defect Classification

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...
Semiconductor Engineering

Classification and Localization of Semiconductor Defect Classes in Aggressive Pitches (imec, Screen)

A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...
Hosted on MSN

After AI crash, DGCA tightens protocols for defect reporting

Months after Air India Boeing 787 Dreamliner crashed in Ahmedabad, claiming 260 lives, the Directorate General of Civil Aviation (DGCA) has hardened the defect-reporting and airworthiness oversight ...