Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...

Escherichia coli bacteria imaged by high-speed inline force mapping and fluorescence microscopy. Simultaneous topography and elastic modulus maps show a stiffening of the division site. Light and ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Kelvin probe force microscopy (KPFM) belongs to a suite of electrical characterization methods made available in scanning probe microscopes. It maps the contact potential difference (CPD) between a ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

Current optical and electron microscopy imaging techniques are not suited for measuring the dynamic characteristics of living microorganisms at tiny scales due to complex sample preparation methods or ...