While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

The main objective of testing, when it comes to semiconductor manufacturing, is to provide a method of guaranteeing product quality. IC manufacturing tests go to the very heart of product reliability.

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Applications such as smart cards and devices used in the defense industry require security features to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement ...

In today’s competitive business landscape, navigating complexity can be a decisive advantage, but it also presents significant challenges. Three crucial trends driving the rise of complexity are ...