In this paper, low power Built-In-Self-Test (BIST) is implemented for 32 bit Vedic multiplier. This paper is to reduce power dissipation in BIST with increased fault coverage. Various methods of ...

As integrated circuits accommodate ever more transistors, the number of test vectors needed to test logic ICs rises dramatically. Design-automation companies are pursuing two design-for-test (DFT) ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

Monitoring the health of a chip post-manufacturing, including how it is aging and performing over time, is becoming much more important as ICs make their way into safety-critical applications such as ...