Chip designers working on advanced nodes typically include a fabric of sensors spread across the die for a number of very specific reasons. In this, the second of a three-part blog series, we explore ...

We present a cost-effective focus monitoring technique based on the illumination and the target co-optimization. An advanced immersion scanner can provide the freeform illumination that enables the ...

Statistical Process Control (SPC) provides the means for the control of product quality and the reduction of process variation. To be successful you need to know how to collect data, understand the ...

The semiconductor manufacturing process involves many steps, including, but not limited to, film deposition, photolithography, etching, and chemical mechanical polishing (CMP). Contamination can ...

This is the second report on the use of on-line monitoring (OLM) in nuclear power plants (NPPs). The first report, focused on the application of OLM to verify the static (calibration) and dynamic ...

On-line monitoring techniques have been under development over the past decades for a variety of applications in process and power industries. In the nuclear power industry, on-line monitoring ...

In this interview, learn how Raman spectroscopy is used as a Process Analytical Technology (PAT) in bioreactor monitoring and control for cultivated meat production. Why look at different ways to ...

Special cause variation, I love to see it! That’s because I know I’m about to learn something important about my process. A ...