The sensitivity of digital circuits to process variations is continuously increasing with scaling in MOSFET devices. The effect of process variations has a substantial impact on the power, performance ...
The rising complexities of semiconductor processes and design are driving an increasing use of on-chip monitors to support data analytics from an IC’s birth through its end of life — no matter how ...
TOKYO, Japan — The failure of EDA tools to predict signal waveforms and signal integrity accurately in advanced manufacturing processes has led NEC Corp. to embed a measurement circuit on-chip to ...
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