Physicists have designed a framework that allows scientists to observe interactions between light and electrons using a traditional scanning electron microscope. The procedure is considerably cheaper ...

Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...